• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Methodology of an Accurate Static I-V Characterization of Power Semiconductor Devices.

Abhinav AryaPankaj KumarSandeep Anand
Published in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
  • semiconductor devices
  • power consumption
  • high quality
  • computationally efficient
  • electron beam
  • neural network
  • data mining
  • sensor networks
  • low cost
  • high precision