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Methodology of an Accurate Static I-V Characterization of Power Semiconductor Devices.
Abhinav Arya
Pankaj Kumar
Sandeep Anand
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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semiconductor devices
power consumption
high quality
computationally efficient
electron beam
neural network
data mining
sensor networks
low cost
high precision