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Extend Tversky's Ratio Model to an Asymmetric Similarity Measurement Model with Three Conditional Parameters: 3p-ASM Model.

Wen HeBapi DuttaYaya LiuRosa M. Rodríguez
Published in: Int. J. Comput. Intell. Syst. (2023)
Keyphrases
  • measurement model
  • prior knowledge
  • probabilistic model
  • feature extraction
  • probability distribution
  • parameter estimation
  • ct images
  • sensitivity analysis