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Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey.

M. S. RanaHemanshu Roy PotaIan R. Petersen
Published in: IEEE Trans Autom. Sci. Eng. (2017)
Keyphrases
  • atomic force microscopy
  • databases
  • digital images
  • neural network
  • artificial intelligence
  • image analysis
  • significant improvement