Login / Signup

Modelling of Process Parameters for 32nm PMOS Transistor Using Taguchi Method.

H. A. ElgomatiB. Y. MajlisA. M. Abdul HamidP. M. SusthithaIbrahim Ahmad
Published in: Asia International Conference on Modelling and Simulation (2012)
Keyphrases
  • high speed
  • maximum likelihood
  • decision making
  • parameter estimation
  • sensitivity analysis
  • real time
  • neural network
  • image processing
  • multiscale
  • expectation maximization
  • estimation process