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Switch-level simulation of total dose effects on CMOS VLSI circuits.

Bharat L. BhuvaJohn J. PaulosRonald S. GyurcsikSherra E. Kerns
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
  • vlsi circuits
  • low power
  • high speed
  • power consumption
  • imaging systems
  • individual level