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Efficient TSV Fault Detection Scheme For High Bandwidth Memory Using Pattern Analysis.
Kwanho Bae
Jongsun Park
Published in:
ISOCC (2020)
Keyphrases
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pattern analysis
detection scheme
high bandwidth
pattern recognition
end to end
computational intelligence
low latency
high density
parallel architectures
image analysis
data analysis
cost effective
database systems
low cost
computer simulation
lightweight