Electrically testable CMOS image pixel circuit.
Masaki HashizumeShingo SaijoHiroyuki YotsuyanngPublished in: ECCTD (2015)
Keyphrases
- image pixels
- circuit design
- analog vlsi
- high speed
- delay insensitive
- low voltage
- cmos technology
- vlsi circuits
- power dissipation
- chip design
- digital circuits
- low power
- neighboring pixels
- power supply
- low cost
- parallel processing
- power consumption
- data points
- computer vision
- nm technology
- metal oxide semiconductor
- ordering constraints
- asynchronous circuits
- image sensor
- pixel values
- face recognition