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RowPress Vulnerability in Modern DRAM Chips.
Haocong Luo
Ataberk Olgun
A. Giray Yaglikçi
Yahya Can Tugrul
Steve Rhyner
Meryem Banu Cavlak
Joël Lindegger
Mohammad Sadrosadati
Onur Mutlu
Published in:
CoRR (2024)
Keyphrases
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high density
main memory
high speed
integrated circuit
risk assessment
buffer overflow
data center
databases
low voltage
real time
database management systems
security vulnerabilities