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Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products.

Esteban Garita-RodríguezRenato Rimolo-DonadioRafael Zamora-Salazar
Published in: ITC (2022)
Keyphrases
  • high volume
  • big data
  • real time
  • user interface
  • high speed
  • test cases
  • embedded systems
  • real world
  • decision support system
  • database
  • data sets
  • machine learning