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Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products.
Esteban Garita-Rodríguez
Renato Rimolo-Donadio
Rafael Zamora-Salazar
Published in:
ITC (2022)
Keyphrases
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high volume
big data
real time
user interface
high speed
test cases
embedded systems
real world
decision support system
database
data sets
machine learning