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A 13T radiation-hardened memory cell for low-voltage operation and ultra-low power space applications.

Chunhua QiLiyi XiaoMingxue HuoTianqi WangRongsheng ZhangXuebing Cao
Published in: ISQED (2017)
Keyphrases
  • low voltage
  • random access memory
  • design considerations
  • x ray
  • image restoration
  • cmos technology
  • ultra low power
  • real time
  • space time