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Estimating Error Rate in Defective Logic Using Signature Analysis.

Zhaoliang PanMelvin A. Breuer
Published in: IEEE Trans. Computers (2007)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • pattern recognition
  • machine learning
  • probabilistic model
  • multi class
  • information theory
  • lower error rates