A Fast Ellipse Detector Using Projective Invariant Pruning.

Qi Jia Xin Fan Zhongxuan Luo Lianbo Song Tie Qiu

Published in: IEEE Trans. Image Process. (2017)

Keyphrases

projective invariants
ellipse fitting
point correspondences
singular points
feature points
detection algorithm
line segments
sift descriptors
projective reconstruction