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A Fast Ellipse Detector Using Projective Invariant Pruning.

Qi JiaXin FanZhongxuan LuoLianbo SongTie Qiu
Published in: IEEE Trans. Image Process. (2017)
Keyphrases
  • projective invariants
  • ellipse fitting
  • point correspondences
  • singular points
  • feature points
  • detection algorithm
  • line segments
  • sift descriptors
  • projective reconstruction