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Impact of Scaling on CMOS Chip Failure Rate, and Design Rules for Hot Carrier Reliability.
Amr Haggag
William McMahon
Karl Hess
Björn Fischer
Leonard F. Register
Published in:
VLSI Design (2001)
Keyphrases
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failure rate
circuit design
high speed
chip design
single chip
low cost
cmos image sensor
power dissipation
feature selection
cmos technology
design process
image sensor
power consumption
physical design
upper bound
association rules
data sets
nm technology