C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Generic lithography modeling with dual-band optics-inspired neural networks.
Haoyu Yang
Zongyi Li
Kumara Sastry
Saumyadip Mukhopadhyay
Mark Kilgard
Anima Anandkumar
Brucek Khailany
Vivek Singh
Haoxing Ren
Published in:
DAC (2022)
Keyphrases
</>
neural network
dual band
fault diagnosis
computer vision
three dimensional