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Generic lithography modeling with dual-band optics-inspired neural networks.

Haoyu YangZongyi LiKumara SastrySaumyadip MukhopadhyayMark KilgardAnima AnandkumarBrucek KhailanyVivek SinghHaoxing Ren
Published in: DAC (2022)
Keyphrases
  • neural network
  • dual band
  • fault diagnosis
  • computer vision
  • three dimensional