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HBIST: An approach towards zero external test cost.

Mayur BubnaKaushik RoyAshish Goel
Published in: VTS (2012)
Keyphrases
  • high cost
  • testing process
  • expected cost
  • data mining
  • learning algorithm
  • feature selection
  • similarity measure
  • expert systems
  • multi class
  • cost sensitive
  • production cost