Two-dimensional analysis of a merged BiPMOS device.

James B. Kuo G. P. Rosseel Robert W. Dutton

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)

Keyphrases

image analysis
three dimensional
statistical analysis
learning algorithm
image processing
multiscale
data acquisition
trade off
pattern recognition
real world
databases
data analysis
image sequences
multimedia
special case
probabilistic model
information retrieval