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Wafer level measurements and numerical analysis of self-heating phenomena in nano-scale SOI MOSFETs.
Giacomo Garegnani
Vincent Fiori
Gilles Gouget
Frederic Monsieur
Clément Tavernier
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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numerical analysis
nano scale
image enhancement
levels of abstraction
higher level
image processing
database
artificial intelligence
computer vision
image analysis
production system
integrated circuit