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Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance.

Yuvraj Singh DhillonAbdulkadir Utku DirilAbhijit ChatterjeeAdit D. Singh
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2006)
Keyphrases
  • high speed
  • error tolerance
  • vlsi circuits
  • machine learning
  • decision trees
  • statistical analysis
  • image coding
  • delay insensitive