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Efficient 3D characterization of raised topological defects in smooth specular coatings.
Pradeep Gnanaprakasam
Johné M. Parker
Subburengan Ganapathiraman
Zhen Hou
Published in:
Image Vis. Comput. (2009)
Keyphrases
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lightweight
neural network
information systems
image segmentation
multi view
computationally expensive
machine vision