LPViT: A Transformer Based Model for PCB Image Classification and Defect Detection.
Kang AnYanping ZhangPublished in: IEEE Access (2022)
Keyphrases
- defect detection
- image classification
- probabilistic model
- formal model
- high level
- feature extraction
- prior knowledge
- genetic algorithm
- experimental data
- mathematical model
- computational model
- em algorithm
- probability distribution
- image representation
- fuzzy logic
- theoretical framework
- management system
- image processing
- neural network