Prediction of the impact of substrate coupled switching noise on frequency synthesizers.
Juan F. OsorioXavier AragonèsPublished in: Microelectron. J. (2012)
Keyphrases
- low frequency
- prediction accuracy
- prediction algorithm
- noisy data
- prediction model
- noise level
- power spectra
- random noise
- noise reduction
- additive noise
- signal to noise ratio
- dielectric constant
- data sets
- noisy images
- hidden markov models
- estimation error
- high frequency
- noise model
- image noise
- edge detection
- image processing
- neural network