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Degradation analysis of high performance 14nm FinFET SRAM.
Daniel Kraak
Innocent Agbo
Mottaqiallah Taouil
Said Hamdioui
Pieter Weckx
Stefan Cosemans
Francky Catthoor
Published in:
DATE (2018)
Keyphrases
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case study
quantitative analysis
data analysis
wireless sensor networks