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Degradation analysis of high performance 14nm FinFET SRAM.

Daniel KraakInnocent AgboMottaqiallah TaouilSaid HamdiouiPieter WeckxStefan CosemansFrancky Catthoor
Published in: DATE (2018)
Keyphrases
  • case study
  • quantitative analysis
  • data analysis
  • wireless sensor networks