A new distance measure for non-identical data with application to image classification.
Muthukaruppan SwaminathanPankaj Kumar YadavObdulio PilotoTobias SjöblomIan CheongPublished in: Pattern Recognit. (2017)
Keyphrases
- data sets
- image classification
- data analysis
- small number
- data collection
- image data
- original data
- data points
- training data
- data distribution
- experimental data
- data processing
- historical data
- prior knowledge
- data sources
- database
- multiscale
- databases
- input data
- test data
- synthetic data
- statistical analysis
- computer systems
- text classification
- feature extraction
- distance measure
- data model
- high quality
- data structure