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Design of highly reliable radiation hardened 10T SRAM cell for low voltage applications.

Raghav ShekharChaudhry Indra Kumar
Published in: Integr. (2022)
Keyphrases
  • highly reliable
  • low voltage
  • design considerations
  • real time
  • cmos technology
  • user interface
  • power consumption
  • response time
  • computer systems