Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks.
Hui HanChenqiang GaoYue ZhaoShisha LiaoLin TangXindou LiPublished in: Pattern Recognit. Lett. (2020)
Keyphrases
- convolutional neural networks
- level set
- image segmentation
- medical images
- segmentation algorithm
- convolutional network
- image analysis
- segmentation method
- region growing
- si sio
- segmentation errors
- segmentation accuracy
- segmented images
- thin film
- high speed
- multiscale
- image processing
- integrated circuit
- shape prior
- fully automatic
- fully unsupervised
- computer vision