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Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages.

Jenna B. KronenbergYoni XiongNicholas J. PieperDennis R. BallBharat L. Bhuva
Published in: IRPS (2024)
Keyphrases
  • flip flops
  • event detection
  • data model
  • computational intelligence
  • multiple input
  • silicon on insulator