Use of source degeneration for non-intrusive BIST of RF front-end circuits.

Anand Gopalan Tejasvi Das Clyde Washburn Ponnathpur R. Mukund

Published in: ISCAS (5) (2005)

Keyphrases

built in self test
radio frequency
high speed
back end
multiscale
relevance feedback
analog vlsi
real world
search engine
vlsi circuits
databases
similarity measure
data structure
data model
hidden markov models
delay insensitive