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Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles.

Henry SwoffordTed Vosk
Published in: IEEE Instrum. Meas. Mag. (2017)
Keyphrases
  • forensic science
  • camera calibration
  • process control
  • single view
  • data sets
  • databases
  • real world
  • fuzzy logic
  • computational intelligence
  • transfer learning
  • law enforcement