Process Diagnosis via Electrical-Wafer-Sorting Maps Classification.
Federico Di PalmaGiuseppe De NicolaoGuido MiragliaOliver M. DonzelliPublished in: ICDM (2005)
Keyphrases
- classification process
- pattern recognition
- support vector
- decision trees
- feature vectors
- classification accuracy
- automatic classification
- text classification
- machine learning
- pattern classification
- training process
- machine learning algorithms
- classification systems
- support vector machine
- integrated circuit
- data sets
- high resolution computed tomography
- computer aided
- process model
- benchmark datasets
- training samples
- unsupervised learning
- model selection
- feature set