Towards the Classification of Error-Related Potentials using Riemannian Geometry.
Yichen TangJerry J. ZhangPaul M. CorballisLuke E. HallumPublished in: CoRR (2021)
Keyphrases
- pattern recognition
- classification accuracy
- classification method
- feature selection
- decision trees
- three dimensional
- support vector
- pattern classification
- image classification
- preprocessing
- text classification
- error rate
- classification scheme
- machine learning
- automatic classification
- high order
- cross validation
- higher order
- support vector machine
- feature vectors
- feature space
- classification algorithm
- shape analysis
- training set