Defect tolerant in-memory analog computing with CMOS-integrated nanoscale crossbars: Invited.

Mingrui Jiang Ruibin Mao John Paul Strachan Can Li

Published in: ICECS (2021)

Keyphrases

analog vlsi
cmos image sensor
analog to digital converter
memory requirements
circuit design
high speed
focal plane
computing power
memory usage
memory space
low cost
computational power
random access
selected papers
limited memory
low power
power supply
defect detection
parallel processing
power consumption