Special issue "Advances in graph-based pattern recognition".
Cheng-Lin LiuBin LuoWalter G. KropatschPublished in: Pattern Recognit. Lett. (2017)
Keyphrases
- special issue
- pattern recognition
- ecml pkdd
- ai edam
- image processing
- signal processing
- international journal
- applied intelligence
- machine learning
- pattern recognition problems
- recent advances
- neural network
- artificial intelligence
- special section
- feature extraction
- image analysis
- computer vision
- pattern classification
- graph model
- real world
- dimensionality reduction
- computer science
- support vector machine svm
- semi supervised