Data Mining using Genetic Programming for Construction of a Semiconductor Manufacturing Yield Rate Prediction System.
Te-Sheng LiCheng-Lung HuangZong-Yuan WuPublished in: J. Intell. Manuf. (2006)
Keyphrases
- semiconductor manufacturing
- data mining
- discrete event simulation
- prediction accuracy
- process control
- prediction error
- predictive modeling
- data analysis
- prediction algorithm
- knowledge discovery in databases
- knowledge discovery
- rough sets
- prediction model
- production system
- text mining
- construction process
- data mining technology
- pattern mining
- association rules
- churn prediction
- customer relationship management
- homeland security
- web mining
- data mining problems
- data warehousing
- real time
- outlier detection
- data mining algorithms
- sufficient conditions
- decision support
- artificial neural networks
- computer science
- knowledge base
- information retrieval
- machine learning
- real world