Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology.
Rafael N. M. OliveiraAlan D. LüdkeCristina MeinhardtPublished in: ICECS (2019)
Keyphrases
- cmos technology
- silicon on insulator
- nm technology
- low power
- metal oxide semiconductor
- logic circuits
- delay insensitive
- rapid development
- power consumption
- high speed
- data processing
- low cost
- logic programming
- infrared
- case study
- modal logic
- real time
- classical logic
- embedded dram
- asynchronous circuits
- information systems
- low voltage
- computer systems
- digital circuits
- circuit design