A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation.
Zilong ShenYize WangYunhao LiXing ZhangYuan WangPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2022)
Keyphrases
- simulation model
- computational model
- experimental data
- analytical model
- probabilistic model
- mathematical model
- conceptual model
- discrete event
- management system
- theoretical analysis
- statistical model
- dynamic characteristics
- real time
- monte carlo simulation
- network model
- formal model
- neural network model
- process model
- cost function
- data model
- reinforcement learning
- multiscale
- decision making
- genetic algorithm