Analysis of masked data with Lindley failure model.
Himanshu RaiM. S. PanwarSanjeev K. TomerPublished in: Commun. Stat. Simul. Comput. (2023)
Keyphrases
- data analysis
- probability distribution
- experimental data
- empirical data
- discrete data
- simulation data
- data acquisition
- test data
- data sets
- data processing
- input data
- data collection
- statistical analysis
- image data
- data points
- probabilistic model
- measured data
- prior knowledge
- raw data
- objective function
- databases
- similarity measure
- training data
- knowledge discovery
- spatial data
- mathematical model
- data sources
- management system
- xml documents
- statistical model
- statistical methods
- prior information
- data quality
- historical data
- computer systems
- learned models
- machine learning