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GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET.

Taeeon ParkJihwan KwakHongjoon AhnJinwoong LeeJaehyuk LimSangho YuChanghwan ShinTaesup Moon
Published in: IEEE Access (2022)
Keyphrases
  • database
  • main contribution
  • development process
  • software engineering
  • lightweight
  • process model
  • conceptual framework
  • unified model
  • framework enables
  • databases
  • neural network
  • genetic algorithm
  • least squares