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Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS.
Qikai Chen
Hamid Mahmoodi-Meimand
Swarup Bhunia
Kaushik Roy
Published in:
VTS (2005)
Keyphrases
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low power
power consumption
neural network
data sets
information systems
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process model
development process
parallel processing
root cause
modeling tool