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Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies.

William Rhett DavisEun Chu OhAmbarish M. SulePaul D. Franzon
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
  • integrated circuit
  • case study
  • open source
  • fourier transform
  • real world
  • high speed
  • frequency domain
  • lessons learned
  • printed circuit boards