Increasing a microscope's effective field of view via overlapped imaging and machine learning.
Xing YaoVinayak PathakHaoran XiAmey ChawareColin L. V. CookeKanghyun KimShiqi XuYuting LiTimothy DunnPavan Chandra KondaKevin C. ZhouRoarke HorstmeyerPublished in: CoRR (2021)
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