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Dielectric Constant and van der Waals Interlayer Interaction of MoS2-Graphene Heterostructures.

Amit SinghSeunghan LeeHoonkyung LeeHiroshi Watanabe
Published in: NEMS (2020)
Keyphrases
  • van der waals
  • inter layer
  • simulation software
  • dielectric constant
  • image processing
  • computer vision
  • multi view
  • rate distortion
  • waveguide