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ANOVA model based moving window approach for RtR control in high-mix semiconductor manufacturing industry.
D. Ling
Y. Zheng
H. J. Fang
H. J. Fan
J. Zhao
Published in:
ECC (2013)
Keyphrases
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manufacturing industry
moving window
supply chain management
control system
statistically significant
databases
data mining
decision making
multimedia
information technology
multiresolution
higher order
statistical analysis
statistical tests