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META: A Layout Based Tool to Estimate the Vulnerability of Digital Circuits to Multiple Event Transient.
Vivek Bansal
Otmane Aït Mohamed
Sowmith Nethula
Published in:
NEWCAS (2022)
Keyphrases
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digital circuits
software tools
steady state
event driven
data sets
reinforcement learning
evolutionary algorithm
hidden markov models
markov chain
event detection
estimation algorithm
model based diagnosis
functional decomposition