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DFT is all I can afford, who cares about Design for Yield or Design for Reliability!

David M. Wu
Published in: ITC (1999)
Keyphrases
  • neural network
  • machine learning
  • expert systems
  • collaborative learning
  • optimal design
  • genetic algorithm
  • computer vision
  • web services
  • high level
  • multiscale
  • artificial neural networks
  • software architecture