Three-Dimensional Stacked Memory System for Defect Tolerance.

Haejun Seo Yoonseok Heo Taewon Cho

Published in: FGIT (2012)

Keyphrases

three dimensional
x ray
multi view
memory requirements
memory size
data structure
information systems
random access
image sequences
viewpoint
image processing
depth map
real world
machine vision
surface reconstruction
memory usage
computing power
databases