Automatic feature selection for adaptive resolution classifiers.
Antonello RizziMassimo PanellaF. M. Frattale MascioliGiuseppe MartinelliPublished in: FUZZ-IEEE (2002)
Keyphrases
- training data
- decision trees
- support vector
- test set
- multiple classifiers
- supervised classification
- svm classifier
- high resolution
- naive bayes
- artificial neural networks
- training set
- classifier combination
- supervised learning
- feature set
- low resolution
- machine learning algorithms
- machine learning methods
- feature extraction
- linear classifiers
- learning algorithm