Wafer Defect Map Classification Using Sparse Convolutional Networks.
Roberto di BellaDiego CarreraBeatrice RossiPasqualina FragnetoGiacomo BoracchiPublished in: ICIAP (2) (2019)
Keyphrases
- image classification
- support vector
- training set
- benchmark datasets
- machine learning
- classification scheme
- pattern recognition
- dictionary learning
- text classification
- classification method
- support vector machine
- classification accuracy
- sparse coding
- classification models
- feature selection
- machine learning methods
- classification algorithm
- training samples
- high dimensional
- feature extraction
- machine learning algorithms
- sparse representation
- markov random field
- pattern classification
- decision trees
- classification systems
- support vector machine svm
- compressive sensing
- classification process
- semiconductor manufacturing
- automatic classification
- preprocessing
- learning algorithm