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Information Leakage Analysis Using a Co-Design-Based Fault Injection Technique on a RISC-V Microprocessor.

Jim PlusquellicDonald E. OwenTom J. MannosBrian Dziki
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
  • fault injection
  • low cost
  • information leakage