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Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress.

N. RensoMatteo BuffoloCarlo De SantiM. RonzaniGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • electro optical
  • infrared
  • physical characteristics
  • satellite imagery
  • computational model