Login / Signup
Comparative Analysis of the Degradation Mechanisms in Logic and I/O FinFET Devices Induced by Plasma Damage.
Gaspard Hiblot
Yefan Liu
Geert Hellings
Geert Van der Plas
Published in:
IRPS (2019)
Keyphrases
</>
comparative analysis
input output
database
fusion scheme
semi quantitative
asynchronous circuits
classical logic
multi valued
mobile devices
smart phones
logic programming
storage devices
file system
modal logic
mechanism design
digital circuits
heterogeneous systems
data structure
neural network
high energy
databases